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Austin Clements authored
Currently we test bitmap repetitions constructed by the compiler (for small arrays) and repetitions performed by GC programs (large arrays and reflect-constructed arrays), but we don't test dynamic repetitions performed by the runtime for slice backing stores. Add tests that parallel the array tests using slices. Change-Id: If4425941a33cc5b20178dd819a7371e347e47585 Reviewed-on: https://go-review.googlesource.com/11422Reviewed-by:
Brad Fitzpatrick <bradfitz@golang.org> Reviewed-by:
Russ Cox <rsc@golang.org>
4b287553
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| .. | ||
| all_test.go | ||
| asm_386.s | ||
| asm_amd64.s | ||
| asm_amd64p32.s | ||
| asm_arm.s | ||
| asm_arm64.s | ||
| asm_ppc64x.s | ||
| deepequal.go | ||
| example_test.go | ||
| export_test.go | ||
| makefunc.go | ||
| set_test.go | ||
| tostring_test.go | ||
| type.go | ||
| value.go |